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Aquila Instruments manufactures the nkd, the most advanced thin film measurement instrument available. The nkd provides non destructive analysis of film thickness, refractive index and absorption for single and multi-layer films on transparent and absorbing substrates. Aquila guarantees expert support and a tailored solution to your thin film measurement application. Please follow the links to the right for more information.
Time for latest news from our company. Last year our loggers were used in various parts of the world for various species. In addition devices fitted in the past have continued to deliver data which is for us of most importance as long-term functionality is our primary objective.
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